Principles And Applications Of Ion Scattering Spectrometry: Surface Chemical And Structural Analysis
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-Introductory, theoretical, and experimental aspects of ion scattering -General features and structural analysis -The recent technique of scattering and recoiling imaging spectrometry -Examples of structural analysis -Ion-surface charge exchange phenomena -Hyperthermal ion-surface interactions
"...useful monograph...recommended...a good reference book that is strong on the principles and limited to one part of the 'applications' of ion scattering spectrometry." (Applied Spectroscopy, Vol. 57, No.8, August 2003)
Low-energy ion scattering spectroscopy (LEIS), sometimes referred to simply as ion scattering spectroscopy (ISS), is a surface-sensitive analytical technique used to characterize the chemical and structural makeup of materials. LEIS involves directing a stream of charged particles known as ions at a surface and making observations of the positions, velocities, and energies of the ions that have interacted with the surface. Data that is thus collected can be used to deduce information about the material such as the relative positions of atoms in a surface lattice and the elemental identity of those atoms. LEIS is closely related to both medium-energy ion scattering (MEIS) and high-energy ion scattering (HEIS, known in practice as Rutherford backscattering spectroscopy, or RBS), differing primarily in the energy range of the ion beam used to probe the surface. While much of the information collected using LEIS can be obtained using other surface science techniques, LEIS is unique in its sensitivity to both structure and composition of surfaces. Additionally, LEIS is one of a very few surface-sensitive techniques capable of directly observing hydrogen atoms, an aspect that may make it an increasingly more important technique as the hydrogen economy is being explored.
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Show caption HideParticle beam interaction using ToF-SIMS. Incident particles bombard the surface liberating single ions (+/-) and molecular compounds. DetailsToF-SIMS uses a focused, pulsed particle beam (typically Cs or Ga) to dislodge chemical species on a materials surface. Particles produced closer to the site of impact tend to be dissociated ions (positive or negative). Secondary particles generated farther from the impact site tend to be molecular compounds, typically fragments of much larger organic macromolecules. The particles are then accelerated into a flight path on their way towards a detector. Because it is possible to measure the "time-of-flight" of the particles from the time of impact to detector on a scale of nano-seconds, it is possible to produce a mass resolution as fine as 0.00X atomic mass units (i.e. one part in a thousand of the mass of a proton). Under typical operating conditions, the results of ToF-SIMS analysis include: a mass spectrum that surveys all atomic masses over a range of 0-10,000 amu,the rastered beam produces maps of any mass of interest on a sub-micron scale, anddepth profiles are produced by removal of surface layers by sputtering under the ion beam.ToF-SIMS is also referred to as "static" SIMS because a low primary ion current is used to "tickle" the sample surface to liberate ions, molecules